Publikace v časopisech

1.

M. Rejhon, X. Zhou, F. Lavini, A. Zanut, F. Popovich, L. Schellack, L. Witek, J. Kunc, E. Riedo, "Giant Increase of Hardness in Silicon Carbide by Metastable Single Layer Diamond-Like Coating", Advanced Science 2023 (2023) 202204562 (7 pages).

2.

M. Rejhon, V. Dědič, R. Grill, J. Franc, U. Roy, R.B. James, "Low-Temperature Annealing of CdZnTeSe under Bias", Sensors 22 (2022) 171 (10 pages).

3.

M. Rejhon, F. Lavini, A. Khosravi, M. Shestopalov, J. Kunc, E. Tossati, E. Riedo, "Relation between interfacial shear and friction force in 2D materials", Nature Nanotechnology 17 (2022) 1280-1287.

4.

M. Rejhon, M. Brynza, R. Grill, E. Belas, J. Kunc, "Investigation of deep levels in semi-insulating vanadium-doped 4H-SiC by photocurrent spectroscopy", Physics Letters A 405 (2021) 127433 (7 pages).

5.

M. Rejhon, J. Kunc, "ZO phonon of a buffer layer and Raman mapping of hydrogenated buffer on SiC(0001)", Journal of Raman Spectroscopy 50 (2019) 465-473.

6.

M. Rejhon, V. Dědič, L. Beran, U. Roy, J. Franc, R.B. James, "Investigation of Deep Levels in CdZnTeSe Crystal and Their Effect on the Internal Electric Field of CdZnTeSe Gamma-Ray Detector", IEEE Transactions on Nuclear Science 66 (2019) 1952-1958.

7.

M. Rejhon, J. Franc, V. Dědič, P. Hlídek, J. Kunc, "The electroluminescent properties based on bias polarity of the epitaxial graphene/aluminium SiC junction", Journal of Physics D: Applied Physics 51 (2018) 265104 (8 pages).

8.

M. Rejhon, J. Franc, V. Dědič, J. Pekárek, U. Roy, R. Grill, R.B. James, "Influence of deep levels on the electrical transport properties of CdZnTeSe detectors", Journal of Applied Physics 124 (2018) 235702 (6 pages).

9.

M. Rejhon, J. Franc, J. Zázvorka, V. Dědič, J. Kunc, "Influence of low-temperature annealing on Schottky barrier height and surface electrical properties of semi-insulating CdTe", Semiconductor Science and Technology 32 (2017) 085007 (6 pages).

10.

M. Rejhon, J. Franc, V. Dědič, J. Kunc, R. Grill, "Analysis of trapping and de-trapping in CdZnTe detectors by Pockels effect", J. Phys. D: Appl. Phys. 49 (2016) 375101 (8 pages).