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1.

R. Grill, P. Hlídek, P. Höschl, K. Lischka, M. Lang, "Interface Trap Conductance Spectroscopy of a Narrow-Gap Hg_1-xCd_xTe (x=0.2) MIS Device", Semicond. Sci. Technol. 10 (1995) 1145-1150.

2.

R. Grill, "Screening in compensated semiconductors", J. Phys.: Condens. Matter 7 (1995) 3565-3576.